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Rohde & Schwarz USA, Inc. - RTE-B1
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16-channel Mixed Signal Digital Oscilloscope

Model: RTE-B1

  • More signal details thanks to high time resolution across the entire memory depth
  • Precise triggering on signal events
  • High acquisition and analysis rate for fast fault finding
  • Straightforward display of digital signals
  • Analysis functions
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With a sampling rate of 5 Gsample/s, the R&S®RTE-B1 option provides a maximum time resolution of 200 ps for all digital channels. This sampling rate is available across the entire memory depth of 100 Msample per channel. As a result, the MSO option is even capable of detecting critical events such as narrow or widely separated glitches. The R&S®RTE-B1 offers numerous trigger types for debugging and analysis, such as edge, width, pattern and serial pattern. These triggers can be combined with holdoff conditions. For the trigger source, the user can choose between individual digital channels or bus signals.

Signal processing of the digital waveforms is done in hardware. This extends from acquisition and triggering to analysis functions such as cursor functions and measurements, and even includes the visualization of the results. This allows an acquisition and analysis rate of more than 200 000 waveforms per second, ensuring that rare events are detected quickly and reliably. The R&S®RTE-B1 option supports 16 digital channels and decoding of up to 4 parallel buses simultaneously. Each bus is represented by an icon on the edge of the screen. The icons can be dragged and dropped onto the screen. The Rohde & Schwarz SmartGrid function supports flexible placement of the relevant signals in a suitable diagram. The icon clearly shows the current status of all activated logic channels (high, low, toggle) regardless of the other oscilloscope settings.
  • More signal details thanks to high time resolution across the entire memory depth
  • Precise triggering on signal events
  • High acquisition and analysis rate for fast fault finding
  • Straightforward display of digital signals
  • Analysis functions
  • Analysis of serial protocols, even with digital channels
  • Low test point loading due to active probe solution
 
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